ブラック ジャック ランキングade Fair Database (J-messe)
ブラック ジャック ランキング - Industrial Automation Show
| Date | September 23, 2025 - September 27, 2025 |
|---|---|
| City / Country |
Shanghai
/
China
/
Asia
|
| Venue |
National Exhibition and Convention Center (NECC)
Expected floor size ：60,000 sq.m.
|
| Items to be exhibited | Factory automation technology, electrical systems, robots, factory automation IT solutions and software |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Hannover Fairs International GmbH / Hannover Milano Fairs Shanghai Ltd.
Address : 301 B&Q Pudong Office Tower, 393 Yinxiao Road, Pudong Tel : +86-21-2055-7128 E-mail : ias@hmf-china.com |
| Message from organizer |
IAS is one of the constituent exhibitions of the China Industrial Fair, which consists of nine exhibitions, including CNC machine tools, metal processing, energy-saving and environmental protection technologies, new-generation information and communication technologies, energy technologies, smart cars, robots, and new materials. It is the largest of its kind in China, attracting nearly 200,000 visitors. We hope that you will use this exhibition as a foothold in the booming Chinese market.
Held with concurrent exhibitions. |
| The representative office, person or agency in Japan |
Deutsche Messe Japan Office (International Linkage) Tel : +81-3-6403-5817 E-mail : masahito.takeo@intl-linkage.co.jp Inquiry Form : https://intl-linkage.co.jp/dm/contact-us/ |
| Industry | |
| Frequency | Annual |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | October 29, 2024 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
