トランプ ゲーム ブラック ジャックade Fair Database (J-messe)
e-Expo & トランプ ゲーム ブラック ジャック
Date | December 25, 2024 - December 28, 2024 |
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City / Country | Hong Kong / China / Asia |
Venue |
Hong Kong Convention and Exhibition Centre |
Items to be exhibited | e-Digital products, photographic & AV equipment, entertainment, startups, automobile products & accessories, automobile conversion & beauty services, electric vehicles |
For Visitors |
Eligibility : Trade & general public
For details, please contact the organizer directly. |
Organizer |
Hongkong-Asia Exhibition (Holdings) Ltd.
Address : 12/F., 228 Electric Road, North Point, Hong Kong Tel : +852-2591-9823 E-mail : hkexhi@hka.com.hk Inquiry Form : https://www.e-expoauto.com.hk/visit.html |
Message from organizer |
The e-Expo & トランプ ゲーム ブラック ジャック features the e-Digital Products Zone, Photographic & AV Equipment Zone, e-Entertainment & Start-up Zone, Automotive Products & Accessories Zone, Automotive Conversion & Beauty Services Zone and Electric Vehicle & Automobile Display Zone, where visitors can snap up popular digital products and enjoy car displays. The expo has also prepared a series of onsite privileges, such as lucky draws, professional talks and performances, bringing various entertainments and gifts to our visitors, presenting an enjoyable journey during the Christmas holidays.
Held with concurrent exhibitions. |
Industry | |
Frequency | Annual |
last fair information |
2021 year Total number of visitors : 1050000 Total number of exhibitors : 820 The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | June 7, 2024 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.