ブラック ジャック アプリade Fair Database (J-messe)
ブラック ジャック アプリ5 - China International Medical Equipment Fair (Spring)
| Date | April 8, 2025 - April 11, 2025 |
|---|---|
| City / Country |
Shanghai
/
China
/
Asia
|
| Venue |
National Exhibition and Convention Center (NECC) |
| Items to be exhibited | Medical, Optical and Electromedical Devices, Smart Healthcare and Wearable Devices, Medical Imaging, Medical Testing, In-vitro Diagnostics, Hospital Construction, Artificial Intelligence (AI), Computed Tomography (CT), Magnetic Resonance Imaging (MRI), Operating Rooms, Molecular Diagnostics, Point-of-care Testing (POCT), Rehabilitation Projects, Rehabilitation Assistive Devices, Ambulance Equipment |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
RX Sinopharm
Department : International Sales and Organization Partnership Person : Ivy Wu Tel : +86-10-84556554 E-mail : haoting.wu@reedsinopharm.com / rust.li@reedsinopharm.com Inquiry Form : https://www.cmef.com.cn/en/contactus?cid=4 |
| Message from organizer | Held with concurrent exhibitions. |
| The representative office, person or agency in Japan |
<Japanese Exhibitor Contact RX Japan Ltd. Department : ISG Tel : +81-80-3357-2546 E-mail : natsumi.inoue@rxglobal.com |
| Industry |
|
| Frequency | Twice a year |
| last fair information |
2024 year Total number of visitors : 310000 Total number of exhibitors : 5000 Expected floor size : 350,000 sq.m. The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | October 21, 2024 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
