Online Trade Fair Database (J-messe)
ブラック ジャック オンライン
| Date | January 26, 2022 - January 28, 2022 |
|---|---|
| City / Country |
Tokyo
/
Japan
/
Asia
|
| Venue |
ブラック ジャック アプリ Survey |
| Items to be exhibited | All about nano-scale technologies: Materials, Nano Carbon, Cellulose Nanofibers, Graphene, Electron Microscope (SEM/TEM), Analytics, Nano Fabrication, Solid State Battery, 5G,6G, Environment and more. |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Secretariat of ブラック ジャック オンライン Executive Committee / JTB Communication Design Inc.
Tel : +81-3-5657-0760 E-mail : nanotech@jtbcom.co.jp Inquiry Form : https://form.qooker.jp/Q/ja/nanotechinquiry/inquiry/ |
| Message from organizer |
Since 2001, The exhibition, "nano tech" is one of largest exhibition in the world held in Tokyo, Japan. This year, it will be held in On-site and On-line as previous show. Nano tech's audience comprises talented individuals from a variety of industries such as 5G, Organic Materials, Electric/Magnetic/Metal/Inorganic Material, Medicine, Cosmetics, Precision Instruments to Machinery, Semiconductors, Electronics, Automotive, Environment/Energy and more. We welcome you at "ブラック ジャック オンライン" on online and onsite. See you in Tokyo and Online!
Held with concurrent exhibitions. |
| Industry |
|
| Frequency | Annual |
| last fair information |
2021 year Total number of visitors : 22704 Total number of exhibitors : 177 （including ： 28 foreign exhibitors） The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | April 6, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
